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ASTM E1250-2010

用电离室评定用于测试硅电子装置辐射强度的钴60辐照器低能伽玛部件的试验方法

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

实施日期: 2010-12-01

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