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BS EN 60512-10-4-2003

电子设备用机电元件的基本测试程序和测量方法.冲击试验(自由元件)、静荷载试验(固定元件)、耐用试验和过载试验.试验10d:电荷过载(连接器)

Steckverbinder fuer elektronische Einrichtungen. Mess-und Pruefverfahren. Aufprallpruefungen (freie Bauelemente),Pruefungen mit statischer Last (feste Bauelemente),Dauerpruefung und Ueberlastpruefungen. Elektrische Ueberlast (Steckverbinder) Connectors for electronic equipment Tests and measurements Part 10-4:Impact tests (free components),static load tests (fixed components),endurance tests and overload tests Test 10d:Electrical overload (connectors) Connecteurs pour equipements electroniques.

适用范围:This part of IEC 60512 applies to the electrical overload test of mated contact pairs of connectors. The object of this test is to draw up a standard method to assess the performance of mated contact pairs of connectors with an electrical overload current flowing through them for a limited period of time between 100 ms and 20 s. The test procedure is based on measuring the increase of temperature during the specified period of time when the electrical overload is applied to the contacts. Temperature increase over time is measured for an electrical overload current, specified as an integer multiple of the rated current, and an overload current-over-time diagram is plotted. NOTE Practice shows that, for limited periods of time, contacts can conduct a multiple of the maximum permissible current without damage to the contact area.

实施日期: 2003-11-13

中标分类号: L23 - 电子元器件与信息技术 - 连接器

ICS分类号: 31.220.10 - 电子学 - 插头和插座装置、连接器

标准组织: BS - 英国标准学会标准

全文来源: WF

中文关键词: 冲击试验 试验 静荷载 连续性试验 电气工程 过载试验 触点 测量方法 电气设备 电插头 碰撞 机电装置 超荷载 元部件 耐久性 电子设备 测量技术 电子仪器 插头和插座连接

语种: 汉语

页数: 10

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