请选择需要导出的字段：
BS EN 60749-17-2003
Halbleiterbauelemente. Mechanische und klimatische Pruefverfahren. Neutronenbestrahlung Semiconductor devices Mechanical and climatic test methods Part 17:Neutron irradiation Dispositifs a semiconducteurs. Methodes d'essais mecaniques et climatiques. Irradiation aux neutrons CORR 15223:June 29,2004
适用范围：The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. The tests described herein are applicable to integrated circuits and discrete semiconductor devices. This test is intended for military-and space-related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 4).
知识产权声明 | 服务承诺 | 联系我们 | 客户服务 | 关于我们
互联网出版许可证：新出网证(京)字042号 互联网药品信息服务资格证书号：(京)-经营性-2011-0017 信息网络传播视听节目许可证 许可证号：0108284
万方数据标准管理系统V1.0 证书号:软著登字第4252816号
京ICP证：010071 京公网安备11010802020237号 京ICP备08100800号-1
客服电话：4000115888 客服邮箱：service@wanfangdata.com.cn 违法和不良信息举报电话：4000115888 举报邮箱：problem@wanfangdata.com.cn 举报专区：https://www.12377.cn
万方数据知识服务平台--国家科技支撑计划资助项目（编号：2006BAH03B01）©北京万方数据股份有限公司 万方数据电子出版社
