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IEC TR 61967-4-1-2005

集成电路 150kHz-1GHz电磁辐射的测量 第4-1部分:传导辐射的测量 1Ω/150Ω直接耦合法 IEC 61967-4应用指南

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4

适用范围:Serves as an application guidance and relates to IEC 61967-4. The division of IC types into -> IC function modules and the software modules for -> cores with CPU can be used for Parts 3, 5 and 6 of IEC 61967. Gives advice for performing test methods described in IEC 61967-4 by classifying types of integrated circuits (ICs) and providing hints for test applications related to the IC type classification. To obtain comparable results of IC emission measurements using IEC 61967-4, definitions are given which are in addition to the general conditions specified in IEC 61967-1 and IEC 61967-4. These definitions concern IC related operating modes, pins and ports to be tested, test set-ups according IEC 61967-4, including description of load circuits and RF path, and IC related emission limits (or limit classes). Parts of the guidance provided by this technical report may be applicable to other parts of IEC 61967.

发布日期: 2005-02-07

实施日期: 2005-02-07

中标分类号: L55,L06 - 电子元器件与信息技术

ICS分类号: 31.200 - 电子学 - 集成电路、微电子学

标准组织: IEC - 国际电工委员会标准

全文来源: WF

语种: 汉语

页数: 47

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