Detail specification for electronic component--Semiconductor red light emiting diodes for types FG313052 FG314053 FG313054 and FG314055
实施日期：1997-01-01
Color Coding of Discrete Semiconductor Devices
发布日期：1980-08-13 实施日期：1988-01-07
Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers
发布日期：1991-08-01 实施日期：1991-08-01
Fibre Optic Active Componets and Devices. Package and Interface Standards. Part 1:General and Guidance Composants Et Dispositifs Actifs En Fibres Optiques. Norme4s De Boitier Et D′Interface. Partie 1:G...
适用范围：This part of IEC 62148 aims to assure interchangeability in physical interfaces between fibre optic active components and devices supplied by different manufacturers, but does not guarantee operation b...
实施日期：2002-03-01
实施日期：2009-03-31
Semiconductor devices; metal cases with ceramic insulation, requirements and tests
适用范围：Semiconductor devices; metal cases with ceramic insulation; requirements and tests
Semiconductor devices--Part 12-5: Optoelectronic devices--Blank detail specification for pin-photodiodes with/without pigtail，for fibre optic systems or subsystems
适用范围：IEC电子元器件质量评定体系遵循IEC章程并在IEC授权下工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子元器件无需进一步试验而为其他所有参加国同样接受。
发布日期：2003-01-24 实施日期：2003-08-01
Measuring methods for parameters of infrared focal plane arrays
适用范围：本标准对红外焦平面阵列特性参数及相关量进行了定义。 本标准给出了红外焦平面阵列特性参数的测试方法及测试条件。 本标准适用于线列和面阵红外焦平面阵列。
发布日期：2013-11-12 实施日期：2014-04-15
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
适用范围：This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. Two tests ...
发布日期：2008-02-12 实施日期：2008-02-12
Use of semiconductor devices outside manufacturer's specified temperature ranges
适用范围：Prescribes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer.
实施日期：2001-07-15
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
适用范围：Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of th...
发布日期：2002-08-30 实施日期：2002-08-30
发布日期：1988-12-29
Standard temperatures for electrical measurement and rating stecification-semiconductor devices
发布日期：1980-07-09 实施日期：1980-07-09
Binary Floating-Point Arithmetic for Microprocessor Systems Arithmetique binaire en virgule flottante pour systemes a microprocesseurs Edition 2
适用范围：Describes sytems which may be applied for binary floating-point arithmetic of microprocessors. Applies to any software and hardware.
实施日期：1989-01-01
Method of measurement for output saturation voltage of semiconductor photocouplers (diodes)
实施日期：1983-07-01
Electrotechnical terminology--Power semiconductor device
适用范围：本标准规定了电力半导体器件的专用术语。 本标准适用于制订标准、编订技术文件、编写和翻译专业手册、教材及书刊。
发布日期：1994-05-16 实施日期：1995-01-01
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