Production equipment for micro-systems - Terms and definitions - Part 2: Basic technologies and production
Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters
发布日期:2011-05-18 实施日期:2011-05-18
实施日期:2007-09-01
发布日期:2012-07-31 实施日期:2012-07-31
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
发布日期:2009-05-28 实施日期:2009-05-28
Testing of materials for semiconductor technology; Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonxide, carbondioxide, hydrogen and ...
Low-voltage fuses . Supplementary requirements for fuse-links for the protection of semiconductor devices
发布日期:2010-01-31 实施日期:2010-01-31
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by usin...
Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters.
Production equipment for microsystems - System for classification of components for microsystems
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography...
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Al, Co, Cu, Na, Ni and Zn in nitric acid with ICP-MS
实施日期:2012-06-08
Semiconductor convertors - Part 2: Self-commutated semiconductor convertors including direct d.c. convertors (IEC 60146-2:1999); German version EN 60146-2:2000
实施日期:2001-02-01
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