DIN 32564-2-2004

微系统加工设备 概念 第2部分:基本工艺和加工

Production equipment for micro-systems - Terms and definitions - Part 2: Basic technologies and production

NF C53-211-2000

Semiconductor convertors - General requirements and line commutated convertors - Part 1-1 : specification of basic requirements.

IEC 60947-4-2-2011

低压开关设备和控制设备 第4-2部分:接触器和电动机起动器 交流半导体电动机控制器和起动器

Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters

发布日期：2011-05-18  实施日期：2011-05-18

DIN EN 60947-4-2-2007

Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters

实施日期：2007-09-01

BS EN 60947-4-2-2012

Low-voltage switchgear and controlgear. Contactors and motor-starters. AC semiconductor motor controllers and starters

发布日期：2012-07-31  实施日期：2012-07-31

IEC 60269-4-2009

低压熔断器 第4部分:保护半导体器件用熔断体的补充要求

Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

发布日期：2009-05-28  实施日期：2009-05-28

DIN 50450-9-2003

半导体工艺材料的检验 载运气体和混合气体中杂质的测定 第9部分:气体分光光度法测定气态氯化氢中的氧、氮、一氧化碳、氢和C1-C3氯化氢

Testing of materials for semiconductor technology; Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonxide, carbondioxide, hydrogen and ...

BS EN 60269-4-2009+A1-2012

低压熔断器 半导体器件保护熔断体的补充要求

Low-voltage fuses . Supplementary requirements for fuse-links for the protection of semiconductor devices

发布日期：2010-01-31  实施日期：2010-01-31

DIN 50451-4-2007

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)

实施日期：2007-02-01

DIN 50450-1-1987

半导体工艺检验和材料;载气体和渗气体中杂质测定;用五氧化二磷测氢中等杂质

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by usin...

NF C63-112-2012

Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - AC semiconductor motor controllers and starters.

EN 60269-4-2009

Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

NF C53-221-2002

半导体自动变换器

Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters.

DIN 32563-2002

显微系统的生产设备.显微元件的分类系统

Production equipment for microsystems - System for classification of components for microsystems

DIN 50450-4-1993

半导体技术的材料试验

Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography...

NF C63-112/A1-2002

Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - AC semiconductor motor controllers and starters.

DIN 50451-3-2003

半导体工艺的材料检验 液体中痕量元素的测定 第3部分:用ICP-MS法测定硝酸中的铝、钴、铜、铁、钠、镍和锌

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Al, Co, Cu, Na, Ni and Zn in nitric acid with ICP-MS

IEEE 1826-2012

Power Electronics Open System Interfaces in Zonal Electrical Distribution Systems Rated Above 100 kW

实施日期：2012-06-08

NF C54-105-1997

大功率电容器.第1部分:概述

Power electronic capacitors. Part 1 : general.

DIN EN 60146-2-2001

半导体变流器.第2部分:自整流整流器包括直接式直流整流器

Semiconductor convertors - Part 2: Self-commutated semiconductor convertors including direct d.c. convertors (IEC 60146-2:1999); German version EN 60146-2:2000

实施日期：2001-02-01