Low-voltage fuses . Supplementary requirements for fuse-links for the protection of semiconductor devices
发布日期:2010-01-31 实施日期:2010-01-31
实施日期:2012-10-01
Niederspannungsschaltgeraete. Schuetze und Motorstarter HalbleiterMotorSteuergerate und Starter fuer Wechselspannung Low-voltage switchgear and controlgear Part 4-2:Contactors and motor-starters AC sem...
适用范围:This standard applies to controllers and starters, which may include a series mechanical switching device, intended to be connected to circuits, the rated voltage of which does not exceed 1 000 V a.c. ...
实施日期:2000-01-01
实施日期:2007-10-01
Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters.
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a ...
适用范围:The standard should define the test method for determining the content of O<(Index)2> in the carrier and doping gases N<(Index)2>, Ar, He, Ne and H<(Index)2>.#,,#
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
适用范围:IEC 60269-4:2009 is to be used in conjunction with IEC 60269-1. This Part 4 supplements or modifies the corresonding clauses or subclauses of Part 1. Fuse-links for the protection of semiconductor devi...
发布日期:2009-05-28 实施日期:2009-05-28
Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography...
适用范围:This document specifies a method for the determination of the volume part of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen in the range between 0,2 and 10 ?l.#,,#
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by usin...
适用范围:The standard determines a test method for the determination of water impurity in carrier gases and doping gases (H<(Index)>2, O<(Index)2>, N<(Index)2>, Ar, He) used in the semi conductor technology.
Production equipment for microsystems - System for classification of components for microsystems
适用范围:The document gives a systematic description, classification and encoding for handling-characteristics of components for microsystems.#,,#
Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters
适用范围:Applies to all types of semiconductor inverters of the self-commutated type and semiconductor convertors which contain at least one part of a self-commutated type, including direct a.c. convertors and ...
发布日期:1999-11-18 实施日期:1999-11-18
发布日期:2012-07-31 实施日期:2012-07-31
Production equipment for micro-systems - Terms and definitions - Part 2: Basic technologies and production
适用范围:This document defines terms, which relate to the basic technologies used for the production of micro-systems. Its purpose is to ease the communication about technical issues by harmonization of the voc...
Testing of materials for semiconductor technology; Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonxide, carbondioxide, hydrogen and ...
请选择需要导出的字段:
请选择需要导出的字段:
知识产权声明 | 服务承诺 | 联系我们 | 客户服务 | 关于我们
网络出版服务许可证:(署)网出证(京)字第072号 互联网药品信息服务资格证书号:(京)-经营性-2016-0015 信息网络传播视听节目许可证 许可证号:0108284
万方数据标准管理系统V2.0 证书号:软著登字第11198474号
京ICP证:010071 京公网安备11010802020237号 京ICP备08100800号-1
客服电话:4000115888 客服邮箱:service@wanfangdata.com.cn 违法和不良信息举报电话:4000115888 举报邮箱:problem@wanfangdata.com.cn 举报专区:https://www.12377.cn
万方数据知识服务平台--国家科技支撑计划资助项目(编号:2006BAH03B01)©北京万方数据股份有限公司 万方数据电子出版社