BS EN 60269-4-2009+A1-2012

低压熔断器 半导体器件保护熔断体的补充要求

Low-voltage fuses . Supplementary requirements for fuse-links for the protection of semiconductor devices

发布日期：2010-01-31  实施日期：2010-01-31

NF C63-112-2012

Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - AC semiconductor motor controllers and starters.

DIN 32561-2012

Production equipment for microsystems. Tray. Dimensions and tolerances

实施日期：2012-10-01

BS EN 60947-4-2-2000

低压开关装置和控制装置.第四部分:接触器和起动器.第二节:AC半导体马达控制器和起动器

Niederspannungsschaltgeraete. Schuetze und Motorstarter HalbleiterMotorSteuergerate und Starter fuer Wechselspannung Low-voltage switchgear and controlgear Part 4-2:Contactors and motor-starters AC sem...

适用范围：This standard applies to controllers and starters, which may include a series mechanical switching device, intended to be connected to circuits, the rated voltage of which does not exceed 1 000 V a.c. ...

实施日期：2000-01-01

DIN 32565-2007

Production equipment for microsystems - Interface between grippers and handling system

实施日期：2007-10-01

EN 60146-2-2000

Semiconductors convertors Part 2: Self-commutated semiconductor converters including direct d.c. converters IEC 60146-2: 1999

DIN EN 60947-4-2-2013

Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters (IEC 60947-4-2:2011 + Cor.: 2012); German version EN 60947-4-2:2012

实施日期：2013-05-01

NF C53-221-2002

半导体自动变换器

Semiconductor converters - Part 2 : self-commutated semiconductor converters including direct d.c. converters.

DIN 50450-2-1991

半导体技术的材料检验.载气体和掺杂气体中杂质的测定.用原电池测定氮,氩,氖和氢中的氧杂质

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a ...

适用范围：The standard should define the test method for determining the content of O<(Index)2> in the carrier and doping gases N<(Index)2>, Ar, He, Ne and H<(Index)2>.#,,#

IEC 60269-4-2009

低压熔断器 第4部分:保护半导体器件用熔断体的补充要求

Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

适用范围：IEC 60269-4:2009 is to be used in conjunction with IEC 60269-1. This Part 4 supplements or modifies the corresonding clauses or subclauses of Part 1. Fuse-links for the protection of semiconductor devi...

发布日期：2009-05-28  实施日期：2009-05-28

DIN 50450-4-1993

半导体技术的材料试验

Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography...

适用范围：This document specifies a method for the determination of the volume part of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen in the range between 0,2 and 10 ?l.#,,#

DIN 50450-1-1987

半导体工艺检验和材料;载气体和渗气体中杂质测定;用五氧化二磷测氢中等杂质

Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by usin...

适用范围：The standard determines a test method for the determination of water impurity in carrier gases and doping gases (H<(Index)>2, O<(Index)2>, N<(Index)2>, Ar, He) used in the semi conductor technology.

DIN 32563-2002

显微系统的生产设备.显微元件的分类系统

Production equipment for microsystems - System for classification of components for microsystems

适用范围：The document gives a systematic description, classification and encoding for handling-characteristics of components for microsystems.#,,#

NF C54-105-1997

大功率电容器.第1部分:概述

Power electronic capacitors. Part 1 : general.

NF C63-112/A2-2007

Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - AC semiconductor motor controllers and starters.

NF C63-112-2000

Low-voltage switchgear and controlgear - Part 4-2 : contactors and motor-starters - A.C. semiconductor motor controllers and starters.

IEC 60146-2-1999

半导体变流器 第2部分:包括直流变流器的自换相半导体变流器

Semiconductor converters - Part 2: Self-commutated semiconductor converters including direct d.c. converters

适用范围：Applies to all types of semiconductor inverters of the self-commutated type and semiconductor convertors which contain at least one part of a self-commutated type, including direct a.c. convertors and ...

发布日期：1999-11-18  实施日期：1999-11-18

BS EN 60947-4-2-2012

Low-voltage switchgear and controlgear. Contactors and motor-starters. AC semiconductor motor controllers and starters

发布日期：2012-07-31  实施日期：2012-07-31

DIN 32564-2-2004

微系统加工设备 概念 第2部分:基本工艺和加工

Production equipment for micro-systems - Terms and definitions - Part 2: Basic technologies and production

适用范围：This document defines terms, which relate to the basic technologies used for the production of micro-systems. Its purpose is to ease the communication about technical issues by harmonization of the voc...

DIN 50450-9-2003

半导体工艺材料的检验 载运气体和混合气体中杂质的测定 第9部分:气体分光光度法测定气态氯化氢中的氧、氮、一氧化碳、氢和C1-C3氯化氢

Testing of materials for semiconductor technology; Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonxide, carbondioxide, hydrogen and ...