实施日期:2008-02-01
Standard test method for dimensions of notches on silicon wafers
适用范围:本标准定性的提供了判定硅片基准切口是否满足标准限度要求的非破坏性测试方法。本方法的测试原理同样适用于其他切口尺寸的测量。 本标准中物体平面尺寸为 0 . 1 mm 时,通过 20 倍的放大后会在投影屏上形成 2 . 0 mm 的...
发布日期:2011-01-10 实施日期:2011-10-01
Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
适用范围:The document describes the general properties and performance characteristics of quartz crystal controlled oscillators.
Quarzoszillatoren mit bewerteter Qualitaet. Norm-Gehaeusemasse und Anschlussdraehte Quartz Crystal Controlled Oscillators of Assessed Quality-Part 3:Standard Outlines and Lead Connections Oscillateurs ...
适用范围:Oscillators, Quartz, Crystals (electronic), Crystal resonators, Piezoelectric devices, Electronic equipment and components, Electrical equipment, Assessed quality, Joints, Drawings
实施日期:2002-02-19
Mono-crystalline silicon as cut slices for photovoltaic solar cells
适用范围:本标准规定了太阳能电池用硅单晶切割片(简称硅片)的技术要求、试验方法、检验规则和标志、包装、运输、贮存及质量证明书与订货单内容。本标准适用于直拉法( CZ / MCZ )制备的地面太阳能电池用硅单晶切割片。
发布日期:2011-01-10 实施日期:2011-10-01
Quartz crystal controlled oscillators of assessed quality. Part 1:Generic specification Edition 3.0
适用范围:This part of IEC 60679 specifies the methods of test and general requirements for quartzcrystal controlled oscillators of assessed quality using either capability approval orqualification approval proc...
实施日期:2007-04-01
Insulators - Glossary of terms and definitions
适用范围:IEC 62223:2009 specifies terms defined in standards that fall under the scope of technical committee TC 36: Insulators. It covers terms that can be found in IEC 60050-471 as well as terms not appropria...
发布日期:2009-06-10 实施日期:2009-06-10
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
适用范围:IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measu...
发布日期:2011-03-14 实施日期:2011-03-14
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
适用范围:The document applies to quartz crystal controlled oscillators whose quality is assessed on the basis of qualification approval. It prescribes the preferred ratings and characteristics, with the appropr...
实施日期:1999-05-01
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units ...
适用范围:In the document some formulae of the appendix to IEC 60444-1 are updated, taking into account the modied calibration procedure of the <pi>-network.#,,#
实施日期:2000-09-01
Specification for silicon annealed wafers
适用范围:本标准规定了半导体器件和集成电路制造用硅退火抛光片的要求、试验方法、检验规则等。本标准适用于线宽 180 nm 、 130 nm 和 90 nm 工艺退火硅片。
发布日期:2011-01-10 实施日期:2011-10-01
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling; identical with IEC 60483, edition 1976
适用范围:This guide relates to dynamic measurements of piezoelectric resonators. Firstly, the high electromechanical coupling associated with ceramic resonators makes the determination of the parameters quite d...
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