IEC 60512-4-1-2003

电子设备用连接器 试验和测量 第4-1部分:电压应力试验 试验4a:耐电压

Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof

发布日期：2003-05-16  实施日期：2003-05-16

BS EN 60512-2-6-2002

电子设备连接器 试验和测量 第2-6部分:带电连续性和接触电阻试验 试验2f:外壳带电连续性

Steckverbinder fuer elektronische Einrichtungen-Mess-und Pruefverfahren. Pruefungen des elektrischen Durchgangs und Durchgangswiderstands. Pruefung 2f. Durchgangswiderstand Gehaeuse (Schirm) Connectors...

实施日期：2002-05-24

DIN EN 60512-2-3-2003

电子设备用连接器 试验和测量方法 第2-3部分:电连续性和接触电阻试验 试验2c:接触电阻波动

Connectors for electronic equipment; Tests and measurements; Part 2-3: Electrical continuity and contact resistance tests; Test 2c: Contact resistance variation

实施日期：2003-01-01

EN 60512-25-4-2001

Connectors for Electronic Equipment - Tests and Measurements Part 25-4: Test 25d - Propagation Delay IEC 60512-25-4:2001

IEC 60664-4-2005

低压系统内设备的绝缘配合 第4部分:高频电压应力的考虑事项

Insulation coordination for equipment within low-voltage systems - Part 4: Consideration of high-frequency voltage stress

发布日期：2005-09-15  实施日期：2005-09-15

DIN EN 60512-25-4-2002

电子设备的连接器.试验和测量.第25-4部分:25d:繁衍延迟

Connectors for electronic equipment - Tests and measurements - Part 25-4: Test 25d: Propagation delay (IEC 60512-25-4:2001); German version EN 60512-25-4:2001

实施日期：2002-08-01

EN 60512-2-3-2002

Connectors for Electronic Equipment - Tests and Measurements Part 2-3: Electrical Continuity and Contact Resistance Tests - Test 2c: Contact Resistance Variation IEC 60512-2-3: 2002

EN 60664-4-2006

Insulation coordination for equipment within low-voltage systems Part 4: Consideration of high-frequency voltage stress Incorporating Corrigendum October 2006; IEC 60664-4:2005

BS EN 60512-2-1-2002

电子设备连接器 试验和测量 第2-1部分:带电连续性和接触电阻试验 试验2a:接触电阻 毫伏法

Steckverbinder fuer elektronische Einrichtungen. Mess-und Pruefverfahren. Pruefungen des elektrischen Durchgangs und Durchgangswiderstands. Pruefung 2a. Durchgangswiderstand. Millivoltmethode Connector...

实施日期：2002-09-30

DIN EN 60512-25-5-2005

电子设备连接器 试验和测量 第25-5部分:25e:回波损耗

Connectors for electronic equipment - Tests and measurements - Part 25-5: Test 25e - Return loss

实施日期：2005-05-01

IEEE 930-2004

电气绝缘耐压数据的统计分析指南

Guide for the statistical analysis of electrical insulation breakdown data

实施日期：2004-09-23

NF C93-400-25-4-2002

Connectors for electronic equipment - Tests and measurements - Part 25-4 : test 25d - Propagation delay.

NF C93-400-2-3-2002

Connectors for electronic equipment - Tests and measurements - Part 2-3 : electrical continuity and contact resistance tests - Test 2c : contact resistance variation.

BS EN 60664-4-2006

Isolationskoordination fuer elektrische Betriebsmittel in Niederspannungsanlagen. Beruecksichtigung von hochfrequenten Spannungsbeanspruchungen Insulation coordination for equipment within low-voltage systems. Part 4:Consideration of high-frequency voltage stress Coordination de l'isolement des materiels dans les systemes (reseaux) a basse tension. Considerations sur les contraintes de tension a haute frequence CORR 16804:December 29,2006;CORR 16921:January 31,2007

实施日期：2006-04-28

IEC 62374-2007

半导体器件 栅电介质薄膜的时间相关电介质击穿试验(TDDB)

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

发布日期：2007-03-29  实施日期：2007-03-29

BS EN 62374-1-2010

Halbleiterbauelemente. Prüfung auf zeitabh?ngigen dielektrischen Durchbruch (TDDB) bei Isolationsschichten zwischen metallischen Leiterbahnen Semiconductor devices Part 1:Time-dependent dielectric breakdown (TDDB) test for inter-metal layers Dispositifs. semiconducteurs. Essai de rupture diélectrique en fonction du temps (TDDB) pour les couches intermétalliques

实施日期：2010-12-31

NF C93-400-1985

电子元件.连接装置.基本试验程序和测量方法

Electronic components. Connecting devices. Basic testing procedures and measuring methods.

实施日期：1985-04-01

ISO 15363-2000

金属材料 管式环液压试验

Metallic materials -- Tube ring hydraulic pressure test

发布日期：2000-08-01  实施日期：2000-08-01

NF C93-400-25-5-2004

Connectors for electronic equipment - Tests and measurements - Part 25-5 : test 25e - Return loss.

NF C93-400-25-3-2002

Connectors for electronic equipment - Tests and measurement - Part 25-3 : test 25c - Rise time degradation.