Prüfungen zum Brandverhalten von Bodenbel?gen. Bestimmung des Brandverhaltens bei Beanspruchung mit einem W?rmestrahler Reaction to fire tests for floorings Part 1:Determination of the burning behaviou...
适用范围:WARNING — The possibility of a gas-air fuel explosion in the test chamber should be recognized.Suitable safeguards consistent with sound engineering practice should be installed in the panel fuelsupply...
实施日期:2010-08-31
Assessment of lighting equipment related to human exposure to electromagnetic fields. Part 1:Results of the EMF measurement campaign from the VDE Test and Certification Institute and ZVEI,the German El...
适用范围:IEC/TR 62493-1:2013(E) presents an overview on EMF measurement results dependent on different lamp technologies used in current luminaires. For the measurement only the test procedure with the so calle...
发布日期:2013-07-09 实施日期:2013-07-09
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
适用范围:IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 15...
发布日期:2010-03-30 实施日期:2010-03-30
Assessment of lighting equipment related to human exposure to electromagnetic fields Evaluation d’un équipement d’éclairage relativement. l’exposition humaine aux champs électromagnétiques Edition 1.0
发布日期:2009-12-10 实施日期:2009-12-01
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
实施日期:2003-01-01
Reaction to fire tests for floorings -- Part 1: Determination of the burning behaviour using a radiant heat source
适用范围:ISO 9239-1:2010 specifies a method for assessing the wind-opposed burning behaviour and spread of flame of horizontally mounted floorings exposed to a heat flux radiant gradient in a test chamber, when...
发布日期:2010-06-01 实施日期:2010-06-01
发布日期:2013-11-19 实施日期:2013-11-19
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
适用范围:Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
发布日期:1997-09-05 实施日期:1997-09-05
Fine ceram (advanced ceram,advanced technical ceram). Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
实施日期:2013-10-14
Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
适用范围:To be read in conjunction with IEC 60747-1, IEC 62007-1, IEC 62007-2
实施日期:1998-01-15
Multimedia systems and equipment - Colour measurement and management - Part 6: Front projection displays
适用范围:IEC 61966-6:2005 defines input test signals, measurement conditions, methods of measurement and reporting of the measured data, to be used for colour characterization and colour management of front pro...
发布日期:2005-03-17 实施日期:2005-03-17
请选择需要导出的字段:
请选择需要导出的字段:
知识产权声明 | 服务承诺 | 联系我们 | 客户服务 | 关于我们
网络出版服务许可证:(署)网出证(京)字第072号 互联网药品信息服务资格证书号:(京)-经营性-2016-0015 信息网络传播视听节目许可证 许可证号:0108284
万方数据标准管理系统V2.0 证书号:软著登字第11198474号
京ICP证:010071 京公网安备11010802020237号 京ICP备08100800号-1
客服电话:4000115888 客服邮箱:service@wanfangdata.com.cn 违法和不良信息举报电话:4000115888 举报邮箱:problem@wanfangdata.com.cn 举报专区:https://www.12377.cn
万方数据知识服务平台--国家科技支撑计划资助项目(编号:2006BAH03B01)©北京万方数据股份有限公司 万方数据电子出版社