Surface chemical analysis -- Auger electron spectroscopy -- Derivation of chemical information
适用范围：ISO/TR 18394:2006 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.
发布日期：2006-08-01 实施日期：2006-08-01
发布日期：2016-09-01 实施日期：2016-09-01
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
适用范围：<p>The acquisition of chemical information from variations in the energy position of peaks in the XPS spectrum is of primary interest in the use of XPS as a surface analytical tool. Surface charging ac...
实施日期：2009-05-01
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
适用范围：Proper preparation and mounting of specimens is particularly critical for surface analysis. Improper preparation of specimens can result in alteration of the surface composition and unreliable data. Sp...
发布日期：2014-10-01 实施日期：2014-10-01
Standard Guide for Handling Specimens Prior to Surface Analysis
适用范围：Proper handling and preparation of specimens is particularly critical for analysis. Improper handling of specimens can result in alteration of the surface composition and unreliable data. Specimens sho...
发布日期：2014-10-01 实施日期：2014-10-01
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
适用范围：<p>Auger electron spectroscopy yields information concerning the chemical and physical state of a solid surface in the near surface region. Nondestructive depth profiling is limited to this near surfac...
实施日期：2008-10-01
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
发布日期：2011-11-01 实施日期：2011-11-01
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
适用范围：<p>Background subtraction techniques in AES were originally employed as a method of enhancement of the relatively weak Auger signals to distinguish them from the slowly varying background of secondary ...
实施日期：2011-10-15
发布日期：2016-09-30 实施日期：2016-09-30
Standard Guide for Performing Sputter Crater Depth Measurements
适用范围：Sputter crater depth measurements are performed in order to determine a sputter rate (depth/time) for each matrix sputtered during a sputter depth profile or similar in-depth type analyses. From sputte...
实施日期：2011-11-01
发布日期：2016-09-01 实施日期：2016-09-01
Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
适用范围：ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X?ray photoelectron spectroscopy (XPS). It includes information t...
发布日期：2011-12-01 实施日期：2011-12-01
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
适用范围：When electron beam excitation is used in AES, the incident electron beam can interact with the specimen material causing physical and chemical changes. In general, these effects are a hindrance to AES ...
实施日期：2010-11-01
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
实施日期：2009-05-01
Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
适用范围：Include the experimental conditions under which spectra are taken in the “Experiment” section of all reports and publications.
实施日期：2010-11-01
Surface chemical analysis -- Characterization of nanostructured materials
适用范围：ISO/TR 14187 provides an introduction to (and some examples of) the types of information that can be obtained about nanostructured materials using surface-analysis tools. Of equal importance, both gene...
发布日期：2011-08-01 实施日期：2011-08-01
Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
适用范围：ISO 18118:2015 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy ...
发布日期：2015-04-01 实施日期：2015-04-01
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