Nuclear power plants - Instrumentation and control important to safety - Development of HDL-programmed integrated circuits for systems performing category A functions
发布日期:2012-01-26 实施日期:2012-01-26
发布日期:2015-02-28 实施日期:2015-02-28
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
实施日期:2010-05-01
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
发布日期:2014-06-30 实施日期:2014-06-30
发布日期:2016-03-01 实施日期:2016-03-01
Semiconductor devices. Discrete devices. Part 17:Magnetic and capacitive coupler for basic and reinforced isolation
实施日期:2011-11-17
Identification cards -- Contactless integrated circuit cards -- Proximity cards -- Part 2: Radio frequency power and signal interface
发布日期:2010-09-01 实施日期:2010-09-01
发布日期:2016-07-01 实施日期:2016-07-01
发布日期:2016-04-13 实施日期:2016-04-13
实施日期:2011-01-01
Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan method
发布日期:2014-09-30 实施日期:2014-09-30
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for semiconductor packages Sili...
发布日期:2013-04-30 实施日期:2013-04-30
发布日期:2012-05-01 实施日期:2012-05-01
发布日期:2016-03-01 实施日期:2016-03-01
发布日期:2011-10-15 实施日期:2011-10-15
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