DIN EN 61338-1-5-2016

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015

发布日期：2016-04-01  实施日期：2016-04-01

NF C93-640-100-2013

Sectional specification : quartz crystal units (Capability Approval)

NF C96-022-29-2012

Semiconductor devices - Mechanical and climatic test methods - Part 29 : latch-up test.

NF C93-621-6-2014

Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)

EN 61338-1-5-2015

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

发布日期：2015-08-28  实施日期：2015-08-28

NF C96-627-1-3-2000

Waveguide type dielectric resonators - Part 1-3 : general information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency.

IEC 62810-2015

Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods

发布日期：2015-02-17  实施日期：2015-02-17

IEC 62604-1-2015

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

发布日期：2015-07-16  实施日期：2015-07-16

DIN EN 62604-1-2016

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2015); German version EN 62604-1:2015

发布日期：2016-04-01  实施日期：2016-04-01

BS EN 61338-1-5-2015

Waveguide type dielectric resonators Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

发布日期：2015-09-30  实施日期：2015-09-30

DIN EN 60749-29-2012

半导体器件 机械和气候试验方法 第29部分：锁定试验

Semiconductor devices. Mechanical and climatic test methods. Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011

EN 62575-1-2016

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

发布日期：2016-02-19  实施日期：2016-02-19

DIN IEC/TS 61994-4-4-2011

频率控制和选择用压电和介电器件 术语 第4-4部分：材料 用于声表面波设备的材料

Piezoelectric and dielectric devices for frequency control and selection. Glossary. Part 4-4: Materials. Materials for surface acoustic wave (SAW) devices (IEC/TS 61994-4-4:2010)

NF C93-626-2001

Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependance (DLD).

NF C93-621-7-2004

Measurement of quartz crystal unit parameters - Part 7 : measurement of activity and frequency dips of quartz crystal units.

ISO 11145-2016

Optics and photonics -- Lasers and laser-related equipment -- Vocabulary and symbols

发布日期：2016-03-01  实施日期：2016-03-01

NF C93-610-2014

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

BS EN 62604-2-2012

Oberfl?chenwellen-(OFW-) und Volumenwellen-(BAW-)Duplexer bewerter Qualit?t. Leitfaden für die Anwendung Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality. Part 2:Guidelines for the use Duplexeurs. ondes acoustiques de surface (OAS) et. ondes acoustiques de volume (OAV) sous assurance de la qualit. Lignes directrices d'utilisation

实施日期：2012-02-29

NF C93-640-201-2014

Blank detail specification: quartz crystal units (Qualification approval)

实施日期：2014-06-21

BS EN 60758-2016

Synthetic quartz crystal - Specifications and guidelines for use

发布日期：2016-09-30  实施日期：2016-09-30