BS ISO 18071-2016

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of antiviral activity of semiconducting photocatalytic materials under indoor lighting environment — Test method using bacteriophage Q-beta

发布日期：2016-07-31  实施日期：2016-07-31

ISO 16525-6-2014

Adhesives -- Test methods for isotropic electrically conductive adhesives -- Part 6: Determination of pendulum-type shear impact

发布日期：2014-05-01  实施日期：2014-05-01

NF C96-034-2-2011

Semiconductor die products - Part 2 : exchange data formats.

ASTM F744M-2010

测量数字集成电路剂量率阈值的试验方法（米制）

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

实施日期：2010-05-01

NF C93-884-5-2011

Fibre optic active components and devices - Performance standards - Part 5 : ATM-PON transceivers with LD driver and CDR ICs.

BS ISO 18061-2014

精细陶瓷(高级陶瓷, 高级工业陶瓷) 半导体光催化材料的抗病毒活性的测定 采用噬菌体Q-β的试验方法

Fine Ceramics (Advanced Ceramics,Advanced Technical Ceramics). Determination of antiviral activity of semiconducting photocatalytic materials. Test method using bacteriophage Q-beta

发布日期：2014-06-30  实施日期：2014-06-30

BS EN 60749-7-2011

Halbleiterbauelemente. Mechanische und klimatische Prüfverfahren. Messung des inneren Feuchtegehaltes und Analyse von anderen Restgasen Semiconductor devices. Mechanical and climatic test methods. Part 7:Internal moisture content measurement and the analysis of other residual gases Dispositifs. semiconducteurs. Méthodes d'essais mécaniques et climatiques. Mesure de la teneur en humiditinterne et analyse des autres gaz résiduels

实施日期：2011-09-30

DIN EN 62148-16-2010

光纤有源元件和器件 包装和接口标准 第16部分:与LC连接器接口一起使用的发射机和接收机元件

Fibre optic active components and devices - Package and interface standards - Part 16: Transmitter and receiver components for use with LC connector interface (IEC 62148-16:2009); German version EN 621...

实施日期：2010-07-01

IEC/IEEE 62659-2015

Nanomanufacturing - Large scale manufacturing for nanoelectronics

发布日期：2015-09-30  实施日期：2015-09-30

BS IEC 60747-8-2010

Semiconductor devices. Discrete devices. Field-effect transistors

实施日期：2011-06-30

ASTM E720-2011

电子设备抗辐射性能试验中使用的中子能谱测定用中子探测器的选择与使用指南

Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

实施日期：2011-06-01

NF C53-211-2011

Semiconductor converters - General requirements and line commutated converters - Part 1-1 : specification of basic requirements.

IEC/TS 62686-1-2015

Process management for avionics. Electronic components for aerospace,defence and high performance (ADHP) applications . Part 1:General requirements for high reliability integrated circuits and discrete semiconductors

发布日期：2015-04-22  实施日期：2015-04-22

BS EN 61290-1-2015

Optical amplifiers. Test methods. Power and gain parameters

发布日期：2015-02-28  实施日期：2015-02-28

IEC 60747-6-2016

Semiconductor devices - Part 6: Discrete devices - Thyristors

发布日期：2016-04-13  实施日期：2016-04-13

BS EN 60191-6-22-2013

半导体器件的器械标准化:表面安装半导体器件封装外形图绘制的一般规则

Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for semiconductor packages Sili...

发布日期：2013-04-30  实施日期：2013-04-30

BS EN 60099-4-2014

避雷器 交流系统用无间隙金属氧化物避雷器

Surge arresters. Metal-oxide surge arresters without gaps for a.c. systems

发布日期：2014-09-30  实施日期：2014-09-30

DIN EN 62007-1-2016

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics (IEC 62007-1:2015); German version EN 62007-1:2015

发布日期：2016-03-01  实施日期：2016-03-01

NF C96-013-6-20-2011

Mechanical standardization of semiconductor devices - Part 6-20 : general rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small o

NF C93-801-2-2009

Semiconductor optoelectronic devices for fibre optic system applications - Part 2 : measuring methods.