BS ISO 14706-2014

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

发布日期：2014-07-31  实施日期：2014-07-31

EN 16016-3-2011

Non destructive testing. Radiation methods. Computed Tomography. Part 3:Operation and interpretation

实施日期：2011-08-01

BS ISO 20903-2011

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

实施日期：2011-11-30

DIN EN 16016-3-2012

Non destructive testing. Radiation methods. Computed tomography. Part 3: Operation and interpretation; German version EN 16016-3:2011

ISO 20903-2011

表面化学分析 俄歇电子分光光度法和X射线光电分光光度法 峰值强度测定方法和报告结果所要求的信息

Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results

发布日期：2011-11-01  实施日期：2011-11-01

BS ISO 10810-2010

Chemische Oberfl?chenanalyse. R?ntgenphotoelektronen-Spektroskopie. Leitfaden für die Analyse Surface chemical analysis-X-ray photoelectron spectroscopy-Guidelines for analysis Analyse chimique des surfaces. Spectroscopie de photoélectrons par rayons X. Lignes directrices pour l'analyse

实施日期：2010-12-31

ISO 14701-2011

表面化学分析 X射线光电子能谱术 二氧化硅厚度的测量

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness

适用范围：ISO 14701:2011 specifies several methods for measuring the oxide thickness at the surfaces of (100) and (111) silicon wafers as an equivalent thickness of silicon dioxide when measured using X-ray phot...

发布日期：2011-08-01  实施日期：2011-08-01

ISO 4993-2015

Steel and iron castings -- Radiographic testing

发布日期：2015-09-01  实施日期：2015-09-01

ASTM D5755-2009

对灰尘进行微真空抽样及借助透射电子显微镜检查作间接分析以便获得石棉组织号数表面负荷的试验方法

Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading

实施日期：2009-12-01

ISO 16243-2011

表面化学分析 X射线光电子能谱术的记录和报告数据

Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

适用范围：ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X?ray photoelectron spectroscopy (XPS). It includes information t...

发布日期：2011-12-01  实施日期：2011-12-01

EN 61191-6-2010

Printed board assemblies - Part 6: Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method

ISO 17867-2015

Particle size analysis -- Small-angle X-ray scattering

发布日期：2015-05-01  实施日期：2015-05-01

NF A09-261-3-2011

Non destructive testing - Radiation methods - Computed tomography - Part 3 : operation and interpretation.

BS ISO 13317-4-2014

通过重力液体沉淀法测定粒度分布 平衡法

Determination of particle size distribution by gravitational liquid sedimentation methods. Balance method

发布日期：2014-11-30  实施日期：2014-11-30

NF C90-708-2010

Printed board assemblies - Part 6 : evaluation criteria for voids in soldered joints of BGA and LGA and measurement method.

DIN EN 61191-6-2011

印制板组装 第6部分:BGA与LGA焊接接头中空隙的评定准则和测量方法

Printed board assemblies - Part 6: Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method (IEC 61191-6:2010); German version EN 61191-6:2010

实施日期：2011-01-01

ASTM E2104-2009

先进航空和涡轮材料及部件射线照相检验规程

Standard Practice for Radiographic Examination of Advanced Aero and Turbine Materials and Components

适用范围：<p>The requirements for radiographic examination in this practice are applicable to all types of metallic and nonmetallic material used in designated applications such as gas turbines and flight struct...

实施日期：2009-01-01

ASTM D5756-2002(2008)

用透射电子显微镜对灰尘作高真空取样和间接分析以获得石棉质量浓度的试验方法

Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Surface Loading

适用范围：<p>This microvacuum sampling and indirect analysis method is used for the general testing of non-airborne dust samples for asbestos. It is used to assist in the evaluation of dust that may be found on ...

实施日期：2002-11-10

BS ISO 16413-2013

X射线反射计用薄膜的厚度、密度和接口宽度的评估 仪器邀请,校准和定位,数据收集,数据分析和报告

Evaluation of thickness,density and interface width of thin films by X-ray reflectometry. Instrumental requirements,alignment and positioning,data collection,data analysis and reporting

发布日期：2013-03-31  实施日期：2013-03-31

BS ISO 16243-2011

Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

实施日期：2011-12-31