Standard Test Methods for Water Vapor Content of Electrical Insulating Gases by Measurement of Dew Point
适用范围:<p>Certain gases have excellent dielectric and electric arc interruption characteristics which make their use in electrical installations very desirable.</p> <p>Water content, as the test parameter, i...
实施日期:1997-04-10
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
适用范围:ISO 14701:2011 specifies several methods for measuring the oxide thickness at the surfaces of (100) and (111) silicon wafers as an equivalent thickness of silicon dioxide when measured using X-ray phot...
发布日期:2011-08-01 实施日期:2011-08-01
请选择需要导出的字段:
请选择需要导出的字段:
知识产权声明 | 服务承诺 | 联系我们 | 客户服务 | 关于我们
网络出版服务许可证:(署)网出证(京)字第072号 药品医疗器械网络信息服务备案:(京)网药械信息备字(2023)第 00470 号 信息网络传播视听节目许可证 许可证号:0108284
万方数据标准管理系统V2.0 证书号:软著登字第11198474号
京ICP证:010071 京公网安备11010802020237号 京ICP备08100800号-1
客服电话:4000115888 客服邮箱:service@wanfangdata.com.cn 违法和不良信息举报电话:4000115888 举报邮箱:problem@wanfangdata.com.cn 举报专区:https://www.12377.cn
万方数据知识服务平台--国家科技支撑计划资助项目(编号:2006BAH03B01)©北京万方数据股份有限公司 万方数据电子出版社