Gurtung und Magazinierung von Bauelementen für automatische Verarbeitung. Gurtung von Bauelementen mit einseitig herausgeführten Anschlüssen Packaging of components for automatic handling-Part 2:Packag...
实施日期:2009-03-31
Connectors for electronic equipment - Tests and measurements - Part 16-5: Mechanical tests on contacts and terminations - Test 16e: Gauge retention force (resilient contacts)
实施日期:2009-03-01
Electromechanical switches for use in electronic equipment; part 4: sectional specification for lever (toggle) switches; identical with IEC 61020-4:1991
Standard Specification for Molybdenum and Molybdenum Alloy Plate,Sheet,Strip,and Foil [: SAE AMS7817B,SAE AMS7817A]
实施日期:2003-11-01
International Electrotechnical Vocabulary-Part 651:Live Working Vocabulaire electrotechnique international. Travaux sous tension
实施日期:1999-12-15
实施日期:2009-04-15
Semiconductor Devices. Mechanical and Climatic Test Methods. Part 2:Low Air Pressure CORRIGENDUM 1
实施日期:2003-08-01
Information technology -- UPnP Device Architecture -- Part 5-12: Digital Security Camera Device Control Protocol - Digital Security Camera Still Image Service
发布日期:2008-11-01 实施日期:2008-11-01
Adjustable speed electrical power drive systems. Part 7-301:Generic interface and use of profiles for power drive systems. Mapping of profile type 1 to network technologies Edition 1.0
实施日期:2007-11-01
Semiconductor Devices. Mechanical and Climatic Test Methods. Part 12:Vibration,Variable Frequency Dispositifs A Semiconducteurs. Methodes D′essais Mecaniques et Climatiques. Partie 12:Vibrations,Freque...
实施日期:2002-04-01
Recommended practice for specifying thyristor-controlled series capacitors
实施日期:2009-09-11
Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals
Steckverbinder fuer elektronische Einrichtungen-Mess-und Pruefverfahren. Pruefungen des elektrischen Durchgangs und Durchgangswiderstands. Pruefung 2f. Durchgangswiderstand Gehaeuse (Schirm) Connectors...
实施日期:2002-05-24
Fixed resistors for use in electronic equipment - Part 1: Generic specification
发布日期:2008-07-21 实施日期:2008-07-21
Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
发布日期:2004-09-24 实施日期:2004-09-24
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
发布日期:2011-03-14 实施日期:2011-03-14
Fixed resistors for use in electronic equipment - Part 4: Blank detail specification: Fixed power resistors. Assessment level F
发布日期:1992-03-15 实施日期:1992-03-15
Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
发布日期:2009-12-10 实施日期:2009-12-10
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